Reference Number. 131304
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Aystorm Scientific Ltd.

Materials characterisation & surface analysis specialising in ion beam analysis including SIMS, uleSIMS, RBS, Auger, XPS, RBS, FIB/TEM and surface contamination (TOF-SIMS, VPD-TXRF, VPD-ICPMS). Semiconductors, photovoltaics, optical coatings.

Aystorm Scientific Ltd.
Sale
Cheshire
M33 6BB
Tel: Click Here for Phone Number

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Keywords - sims analysis - tem analysis - tof-sims - auger - rutherford

sims analysis
tem analysis
tof-sims
auger

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Materials characterisation & surface analysis specialising in ion beam analysis including SIMS, uleSIMS, RBS, Auger, XPS, RBS, FIB/TEM and surface contamination (TOF-SIMS, VPD-TXRF, VPD-ICPMS). Semiconductors, photovoltaics, optical coatings.